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Gases
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Etching Gases

High Performance Products for Submicron Performance

Etching and cleaning gases play an important role in the manufacturing of integrated circuits. As layer after layer of material is deposited on the wafer surface, each must be cleaned and etched to exacting tolerances. Etching gases are used in the process of integrated circuit fabrication to selectively remove excess materials such as silicon, silicon dioxide and silicon nitride in a defined pattern. In early IC manufacturing, wet chemistry etching (acid dip method) was used to etch waters. Today, due to the inability of wet etching to achieve acceptable fidelity of pattern transfer below two microns, plasma etching is the preferred method particularly in thin film etching for advanced applications.

With plasma etching, a number of organic and inorganic fluorides, chlorides and/or bromides (plasma etchants) react with the substrate layer to form volatile products that evaporate from the wafer surface and can be easily removed from the process. Plasma etch responses that must be considered to optimize the overall process include:
  • Etching rate
  • Loss of critical dimension
  • Edge profile
  • Uniformity of etching
  • Selectivity

Etching gases are used alone or in various combinations with other gases to achieve optimum process performance in terms of rate, selectivity, anisotropy and uniformity. Scott offers a wide range of products used in wafer etching and cleaning applications. Pure gases are available in a variety of purity grades. In most cases, Scott gas mixtures are provided in various purity grades of minor components and balance gases. These gases, along with available concentrations and balance gases, are summarized in the tables below.

For more detailed information on specific gases, see the individual product listings in the Pures and Mixtures sections.

Plasma Etching with Halocarbons

Halocarbons are a convenient source of reactive fluorine atoms for plasma etching because they are available in high-purity, and are nonflammable and relatively nontoxic. In addition, the variety of halocarbons available facilitates a wide degree of control over the etching process. They are often used to etch both conductive and insulating films of an organic or inorganic nature.

Halocarbons are commonly used in combinations or with other gases to meet the rate, selectivity and anisotropy requirements of a particular process.

For example, adding up to 10% oxygen to Halocarbon 14 increases the etch rate of polysilicon, refractory metals and metal silicides. It also improves etch selectivity versus silicon dioxide, a common underlying film.

Over the past several years, much attention has been focused on the use of halocarbons for plasma etching applications. Scott works closely with its suppliers to provide our customers with the highest quality products available.

Complete Product Line

There is often considerable discussion regarding etchant gas purity requirements. Studies involving polysilicon etching using both organic etchants (i.e. CF4, CF3Br and CF2Cl2) and inorganic etchants (i.e. Cl2, HCl and SF6) demonstrate the importance of both types of etchants, as well as the concentration of impurities they may contain. Typical impurities of concern include oxygen, nitrogen, moisture, hydrocarbons and various metals.

Scott offers both organic and inorganic cleaning and etching products for the semiconductor industry. Our product line includes many different pure gases of various grades to fit your application - all with guaranteed impurity specifications.

For example, we offer two grades of Halocarbon 14 (tetrafluoromethane). In addition, our cleaning and etching mixtures are available with different component specifications as well as different blend tolerances and certifications. This web site includes only the more commonly used gases for cleaning and etching. If your application requires different gases, or gases with more stringent specifications, contact us with your requirements.
Plasma Etching Mixtures
CONCENTRATION (Vol. %) CYLINDER
SIZE
CONTENTS
(cu. ft.)
PRESSURE
(psig)
O2 CF4 He
4% 96%   A 83 650
B 24 500
C 10 500
8% 92%   A 83 650
B 24 500
C 10 500
10% 90%   A 83 650
B 24 500
C 10 500
8.5% 91.5%   A 83 650
B 24 500
C 10 500
1.76% 18.94% 79.3% A 70 650
B 21 500
C 9 500
0.485% 3% 96.515% A 214 2000
B 84 2000
C 33 2000
39.91% 0.22% 59.87% A 214 2000
B 84 2000
C 33 2000
92% 8%   A 249 2000
B 90 2000
C 35 2000
97% 3%   A 249 2000
B 90 2000
C 35 2000
17.5% 82.5%   A 83 650
B 24 500
C 9 500

 

Scott Gas Mixtures from the Electronic Materials Group
MIXTURE COMPONENT
GRADE
BALANCE GAS
GRADE
BALANCE GASES AVAILABLE CONCENTRATION
Ar
He
N2
H2
SF6
Carbon Monoxide 99.99% V.L.S.I.         20% - 30%
99.9% Electronic        
Chlorine V.L.S.I. V.L.S.I.     1000 ppm - 3%
Electronic Electronic    
Halocarbon 14 V.L.S.I. V.L.S.I.   1% - 50%
Electronic Electronic  
Electronic M.O.S.  
Halocarbon 23 Eelectronic V.L.S.I.   1% - 50%
Electronic  
M.O.S.  
Halocarbon 116 Etchant V.L.S.I.   1% - 50%
Electronic Electronic  
Eelectronic M.O.S.  
Hydrogen Chloride V.L.S.I. V.L.S.I.   1000 ppm - 5%
Electronic Electronic  
Eelectronic M.O.S.  
Silicon
Tetrafluoride
99.99% V.L.S.I.   100 ppm - 10%
Electronic  
M.O.S.  
Sulfur
Hexafluoride
V.L.S.I. V.L.S.I.   5 ppm - 5%
Electronic Electronic  

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